Channel Type |
N |
Channel Mode |
Enhancement |
Configuration |
Single Quad Drain Triple Source |
Maximum Drain Source Voltage (V) |
60 |
Material |
Si |
Maximum Continuous Drain Current (A) |
100 |
Maximum Absolute Continuous Drain Current (A) |
100 |
Maximum Gate Source Voltage (V) |
±20 |
Maximum Drain Source Resistance (mOhm) |
6.8@10V |
Breakdown Voltage Type |
DSS |
Typical Gate Charge @ Vgs (nC) |
15@10V|7.3@4.5V |
ID For GFS (A) |
18 |
VDS For GFS (V) |
30 |
Maximum Input Capacitance @ Vds (pF) |
1500@30V |
Typical Gate Charge @ 10V (nC) |
15 |
Operating Junction Temperature (°C) |
-55 to 150 |
Maximum Power Dissipation (mW) |
3200 |
Process Technology |
NexFET |
Minimum Gate Threshold Voltage (V) |
1.7 |
Category |
Power MOSFET |
Typical Output Capacitance (pF) |
280 |
Typical Gate to Drain Charge (nC) |
2.9 |
Typical Gate to Source Charge (nC) |
3.3 |
Maximum Junction Ambient Thermal Resistance |
50°C/W |
Typical Gate Resistance (Ohm) |
1.5 |
Maximum Junction Case Thermal Resistance |
1.3°C/W |
Maximum Positive Gate Source Voltage (V) |
20 |
Maximum Gate Resistance (Ohm) |
3 |
Typical Input Capacitance @ Vds (pF) |
1150@30V |
Typical Gate Threshold Voltage (V) |
2 |
Typical Reverse Transfer Capacitance @ Vds (pF) |
3.9@30V |
Typical Reverse Recovery Charge (nC) |
63 |
Typical Diode Forward Voltage (V) |
0.8 |
Maximum Diode Forward Voltage (V) |
1 |
Typical Reverse Recovery Time (ns) |
49 |
Typical Forward Transconductance (S) |
60 |
Maximum Pulsed Drain Current @ TC=25°C (A) |
251 |
Typical Turn-On Delay Time (ns) |
3.2 |
Typical Turn-Off Delay Time (ns) |
11.4 |
Typical Fall Time (ns) |
1.7 |
Typical Rise Time (ns) |
6.3 |
Maximum Gate Source Leakage Current (nA) |
100 |
Maximum Gate Threshold Voltage (V) |
2.4 |
Maximum IDSS (uA) |
1 |
Number of Elements per Chip |
1 |
Minimum Storage Temperature (°C) |
-55 |
Maximum Storage Temperature (°C) |
150 |
Minimum Operating Temperature (°C) |
-55 |
Maximum Operating Temperature (°C) |
150 |
Tradename |
NexFET™ |