Channel Type |
N |
Channel Mode |
Enhancement |
Configuration |
Single |
Maximum Drain-Source Voltage (V) |
650 |
Maximum Absolute Continuous Drain Current (A) |
31.2 |
Maximum Continuous Drain Current (A) |
31.2 |
Maximum Gate-Source Voltage (V) |
20 |
Maximum Drain-Source Resistance (mOhm) |
110@10V |
Breakdown Voltage Type |
DSS |
Typical Gate Charge @ Vgs (nC) |
118@10V |
Operating Junction Temperature (°C) |
-55 to 150 |
Typical Gate Charge @ 10V (nC) |
118 |
Maximum Power Dissipation (mW) |
277800 |
Process Technology |
CoolMOS |
Minimum Gate Threshold Voltage (V) |
3.5 |
Category |
Power MOSFET |
Typical Output Capacitance (pF) |
160 |
Typical Gate to Drain Charge (nC) |
64 |
Typical Gate to Source Charge (nC) |
21 |
Maximum Junction Ambient Thermal Resistance (°C/W) |
62 |
Typical Gate Resistance (Ohm) |
1.3 |
Maximum Junction Case Thermal Resistance (°C/W) |
3.6 |
Maximum Positive Gate-Source Voltage (V) |
20 |
Typical Gate Threshold Voltage (V) |
4 |
Typical Input Capacitance @ Vds (pF) |
3240@100V |
Typical Diode Forward Voltage (V) |
0.9 |
Typical Reverse Recovery Charge (nC) |
800 |
Typical Reverse Recovery Time (ns) |
150 |
Maximum Pulsed Drain Current @ TC=25°C (A) |
99.6 |
Typical Turn-On Delay Time (ns) |
16 |
Typical Turn-Off Delay Time (ns) |
68 |
Typical Fall Time (ns) |
6 |
Typical Rise Time (ns) |
11 |
Maximum Gate-Source Leakage Current (nA) |
100 |
Maximum Gate Threshold Voltage (V) |
4.5 |
Maximum IDSS (uA) |
1.5 |
Number of Elements per Chip |
1 |
Minimum Storage Temperature (°C) |
-55 |
Maximum Storage Temperature (°C) |
150 |
Minimum Operating Temperature (°C) |
-55 |
Maximum Operating Temperature (°C) |
150 |
Tradename |
CoolMOS™ |